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Recent #Infrared Spectroscopy news in the semiconductor industry

azonano
4 months ago

Park Systems Expands FX Large Sample AFM Lineup to Power Next-Gen Industrial Innovation

➀ Park Systems has expanded its FX Large Sample AFM lineup with the introduction of Park FX300 for 300mm wafer analysis;

➁ The Park FX300 is designed for high-precision analysis without the complexity of a fully automated inline system;

➂ The system is equipped with specialized features for long-range flatness measurements, precise sample alignment, and enhanced sample visualization.

AFMInfrared SpectroscopyPark Systemssemiconductor
azonano
10 months ago

Introducing the Most Advanced Nano-chemical Meteorology Instrument

➀ The Vista 300 from Molecular Vista combines AFM and infrared spectroscopy to offer Photo-induced Force Microscopy (PiFM) with a spatial resolution of <5 nm, superior to methods like TOF-SIMS or XPS. ➁ PiFM can map and identify molecules, including organic or polymeric contaminants, inorganic particles, or EUV resist films. ➂ The instrument is designed for full 300 mm wafer analysis with a compact footprint and includes new automation features like AutoPiFM and AutoAlign for ease of use.
AFMInfrared SpectroscopyMeteorology InstrumentMolecular VistaNano-chemicalNanofabricationPiFMQuantum Designsemiconductor